4. B modeling#

4.1. Material properties#

Damaging behavior:

\(\begin{array}{c}{\sigma }_{\mathit{seuil}}^{T}\mathrm{=}3\mathit{MPa}\\ {\sigma }_{\mathit{seuil}}^{C}\mathrm{=}40\mathit{MPa}\\ {E}_{T}\mathrm{=}\mathrm{-}6000\mathit{MPa}\end{array}\)

4.2. Charging path#

The element is subjected to uniaxial compression.

4.3. Tested sizes and results#

Instant

Field Name

Component

Location

Aster

25

DEPL

\(\mathit{DX}\)

\(\mathit{N2}\)

—1.28E-05

25

SIEF_ELGA

\(\mathit{SIXX}\)

\(\mathit{M1}\), point 1

—3.84E+07

25

VARI_ELGA

\(\mathit{V1}\)

\(\mathit{M1}\), point 1

0.00E+00

27

DEPL

\(\mathit{DX}\)

\(\mathit{N2}\)

—1.37E-05

27

SIEF_ELGA

\(\mathit{SIXX}\)

\(\mathit{M1}\), point 1

—4.06405E+07

27

VARI_ELGA

\(\mathit{V1}\)

\(\mathit{M1}\), point 1

2.90913E-02

37

DEPL

\(\mathit{DX}\)

\(\mathit{N2}\)

—1.82E-05

37

SIEF_ELGA

\(\mathit{SIXX}\)

\(\mathit{M1}\), point 1

—4.55227E+07

37

VARI_ELGA

\(\mathit{V1}\)

\(\mathit{M1}\), point 1

1.00E+00